Radioelektronikos terminų žodynas. – Vilnius : BĮ UAB „Litimo“. Kazimieras Gaivenis, Gytis Juška, Vidas Kalesinskas. 2000.
Surface analysis tools — include AES (Auger Electron Spectroscopy); ESCA (Electron Spectroscopy for Chemical Analysis), also known as XPS (X ray photoelectron spectroscopy); and SSIM (Static secondary ion mass spectrometry). Surface analysis tools are most often used to… … Wikipedia
surface analysis — ▪ chemistry Introduction in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… … Universalium
formation du profil de la surface — paviršiaus profiliavimas statusas T sritis radioelektronika atitikmenys: angl. surface profiling vok. Oberflächenprofilierung, f rus. профилирование поверхности, n pranc. formation du profil de la surface, f … Radioelektronikos terminų žodynas
Geographic profiling — is a criminal investigative methodology that analyzes the locations of a connected series of crimes to determine the most probable area of offender residence. Typically used in cases of serial murder or rape (but also arson, bombing, robbery, and … Wikipedia
Neutron depth profiling — (NDP) is a near surface analysis technique that is commonly used to obtain profiles of concentration as a function of depth for certain technologically important light elements in nearly any substrate. The technique was first proposed by Ziegler… … Wikipedia
Apollo Lunar Surface Experiments Package — ALSEP Station ALSEP de la mission Apollo 16. L Apollo Lunar Surface Experiments Package (ALSEP) est un ensemble d instruments scientifiques installé par les astronautes des 6 missions du programme Apollo à la surface de la Lune entre 1969 et … Wikipédia en Français
Optical interferometry — combines two or more light waves in an optical instrument in such a way that interference occurs between them. Early interferometers used white light sources and also monochromatic light from atomic sources (e.g., Young s double slit experiment… … Wikipedia
Confocal laser scanning microscopy — (CLSM or LSCM) is a technique for obtaining high resolution optical images with depth selectivity.[1] The key feature of confocal microscopy is its ability to acquire in focus images from selected depths, a process known as optical sectioning.… … Wikipedia
Confocal microscopy — Diagnostics MeSH D018613 OPS 301 code 3 301 … Wikipedia
KLA Tencor — Infobox Company company name = KLA Tencor Corporation company company type = Public company|Public] (NASDAQ|KLAC) slogan = Accelerating Yield foundation = 1997 location = San Jose, California key people = Edward W. (Ned) Barnholt, Chairman… … Wikipedia
